Back مجهر إلكتروني ماسح Arabic Сканиращ електронен микроскоп Bulgarian ক্রমবেক্ষক ইলেকট্রন অণুবীক্ষণ যন্ত্র Bengali/Bangla Skenirajući elektronski mikroskop BS Microscopi electrònic de rastreig Catalan مایکڕۆسکۆپی ئەلێکتڕۆنی سکانەر CKB Rastrovací elektronový mikroskop Czech Rasterelektronenmikroskop German Ηλεκτρονικό μικροσκόπιο σάρωσης Greek Scanning electron microscope English
The scanning electron microscope (SEM) is a type of electron microscope that uses a focused beam of high-energy electrons in producing a variety of signals at the surface of a solid specimen. The signals produced by the interacting electrons contain useful information such as the shape, atomic structure and conductivity.