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JTAG (named after the Joint Test Action Group which codified it) is an industry standard for verifying designs of and testing printed circuit boards after manufacture.
JTAG implements standards for on-chip instrumentation in electronic design automation (EDA) as a complementary tool to digital simulation.[1] It specifies the use of a dedicated debug port implementing a serial communications interface for low-overhead access without requiring direct external access to the system address and data buses. The interface connects to an on-chip Test Access Port (TAP) that implements a stateful protocol to access a set of test registers that present chip logic levels and device capabilities of various parts.
The Joint Test Action Group formed in 1985 to develop a method of verifying designs and testing printed circuit boards after manufacture. In 1990 the Institute of Electrical and Electronics Engineers codified the results of the effort in IEEE Standard 1149.1-1990, entitled Standard Test Access Port and Boundary-Scan Architecture.
The JTAG standards have been extended by many semiconductor chip manufacturers with specialized variants to provide vendor-specific features.[2]
- ^ Neal Stollon (2011). On-Chip Instrumentation. Springer.
- ^ Randy Johnson, Steward Christie (Intel Corporation, 2009), JTAG 101—IEEE 1149.x and Software Debug